Cleanliness – particle analyses
Analysis of component cleanliness provides information about the number, size and reflection characteristics of particles.
Following complementary examinations of particles are possible in our laboratory.
- FTIR-spectroscopy of organic particles (for example plastics, cardboard, fibres)
- Raster electron microscopy (SEM) or rather energy dispersive X-ray spectroscopy (EDX) of metallic particles
- Three-dimensional depiction of particles in a digital microscope
A comparison with our comprehensive spectra library follows subsequently. With these analyses, the origin of the particles can often be clarified by also scrutinising the materials of the components as a reference sample. This is especially important during the development stage of the components or the manufacture-accompanying cleaning procedures, viz. an introduction of particles in a facility or machine can be located through an allocation of the particles to the corresponding materials or operating materials.